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» Post-Layout Optimization for Deep Submicron Design
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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 1 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
ICCAD
1999
IEEE
97views Hardware» more  ICCAD 1999»
13 years 12 months ago
A methodology for correct-by-construction latency insensitive design
In Deep Sub-Micron (DSM) designs, performance will depend critically on the latency of long wires. We propose a new synthesis methodology for synchronous systems that makes the de...
Luca P. Carloni, Kenneth L. McMillan, Alexander Sa...
DAC
2003
ACM
14 years 8 months ago
Multilevel global placement with retiming
Multiple clock cycles are needed to cross the global interconnects for multi-gigahertz designs in nanometer technologies. For synchronous designs, this requires retiming and pipel...
Jason Cong, Xin Yuan
ICCAD
2002
IEEE
113views Hardware» more  ICCAD 2002»
14 years 4 months ago
Interconnect-aware high-level synthesis for low power
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
Lin Zhong, Niraj K. Jha
ICCAD
2001
IEEE
100views Hardware» more  ICCAD 2001»
14 years 4 months ago
Coupled Analysis of Electromigration Reliability and Performance in ULSI Signal Nets
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Kaustav Banerjee, Amit Mehrotra