296 search results - page 23 / 60 » Power Estimation in Sequential Circuits |
ICCD
2001
IEEE
14 years 5 months ago
2001
IEEE
Dynamic power is the main source of power consumption in CMOS circuits. It depends on the square of the supply voltage. It may significantly be reduced by scaling down the supply ...
DAC
1996
ACM
14 years 5 days ago
1996
ACM
1 In this paper, we propose a hybrid approach for estimating the switching activities of the internal nodes in logic circuits. The new approach combines the advantages of the simul...
DAC
1997
ACM
14 years 6 days ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...