A summary of electrical and optical approaches to clock distribution within high-performance microprocessors is presented. System-level properties of intrachip electrical clock dis...
A. V. Mule, Elias N. Glytsis, Thomas K. Gaylord, J...
† The limits on CMOS energy dissipation imposed by subthreshold leakage currents and by wiring capacitance are investigated for CMOS generations beyond 50nm at NTRS projected loc...
Azeez J. Bhavnagarwala, Blanca Austin, Ashok Kapoo...
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
- The power dissipation (PT) and delay time (tdT) of a CMOS clock driver were minimized. Eight test circuits, each of which has 2 two-stage clock drivers, and a register array were...
As embedded systems continue to face increasingly higher performance requirements, deeply pipelined processor architectures are being employed to meet desired system performance. ...