Abstract--In sub-100 nm CMOS processes, delay and leakage power reduction continue to be among the most critical design concerns. We propose to exploit the recent availability of f...
Kwangok Jeong, Andrew B. Kahng, Chul-Hong Park, Ha...
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors i...
John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S....
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
Abstract - This paper describes the development of a concurrent methodology for standard cell library generation. Use of a novel physical design automation method enables a high de...
Donald G. Baltus, Thomas Varga, Robert C. Armstron...