It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong ...
— Dynamic power noises may not only degrade the circuit performance but also reduce the noise margin which may result in the functional errors in integrated circuit. Decoupling c...
The relentless scaling of CMOS technology has provided a steady increase in processor performance for the past three decades. However, increased power densities (hence temperature...
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, J...
- A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range o...