387 search results - page 4 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
ICCD
2002
IEEE
14 years 14 days ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
SAC
2009
ACM
14 years 2 months ago
2009
ACM
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
ISSRE
2003
IEEE
14 years 24 days ago
2003
IEEE
Testing is often performed frequently during development to ensure software reliability by catching regression errors quickly. However, stopping frequently to test also wastes tim...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...