387 search results - page 5 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
ET
2002
13 years 7 months ago
2002
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
TIM
2011
13 years 2 months ago
2011
—Low-cost networked fluid flow velocity sensors are needed for high-density sampling in environmental research and other applications requiring automated fluid flow velocity mapp...