282 search results - page 11 / 57 » Reliability- and process-variation aware design of integrate... |
ISQED
2005
IEEE
14 years 3 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
ISPD
2010
ACM
14 years 5 months ago
2010
ACM
Standard cells are fundamental circuit building blocks designed at very early design stages. Nanometer standard cells are prone to lithography proximity and process variations. Ho...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of m ods to enforce tunable expiration dates for chips using nanom reliab...