282 search results - page 13 / 57 » Reliability- and process-variation aware design of integrate... |
MICRO
2009
IEEE
14 years 3 months ago
2009
IEEE
Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
ICCAD
2007
IEEE
14 years 6 months ago
2007
IEEE
Abstract— Thermal issues are a primary concern in the threedimensional (3D) integrated circuit (IC) design. Temperature, area, and wire length must be simultaneously optimized du...
ICCAD
2001
IEEE
14 years 6 months ago
2001
IEEE
In this paper a layout-aware RF synthesis methodology is presented. The methodology combines the power of a differential evolution algorithm with cost function response modeling a...
MR
2007
13 years 8 months ago
2007
Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.
DAC
2009
ACM
14 years 3 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...