282 search results - page 32 / 57 » Reliability- and process-variation aware design of integrate... |
TVLSI
2010
13 years 3 months ago
2010
By storing more than one bit in each memory cell, multi-level per cell (MLC) NAND flash memories are dominating global flash memory market due to their appealing storage density ad...
MICRO
2008
IEEE
14 years 3 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
This paper proposes Noise-Direct, a design methodology for power integrity aware floorplanning, using microarchitectural feedback to guide module placement. Stringent power constr...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
DAC
2007
ACM
14 years 29 days ago
2007
ACM
With the continuous increase of circuit density, interconnect length, and aspect ratio, the influence of capacitive and inductive coupling on timing characteristics of integrated ...