282 search results - page 9 / 57 » Reliability- and process-variation aware design of integrate... |
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
DAC
2009
ACM
14 years 1 months ago
2009
ACM
We present an unconventional clock distribution that emphasizes flexibility and layout independence. It suits a variety of applications, clock domain shapes and sizes using a modu...
DAC
2009
ACM
14 years 3 months ago
2009
ACM
This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance mono...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...