161 search results - page 7 / 33 » Reliable Systems on Unreliable Fabrics |
DFT
2008
IEEE
14 years 1 months ago
2008
IEEE
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
ISIPTA
2003
IEEE
14 years 19 days ago
2003
IEEE
A second-order hierarchical uncertainty model of a system of independent random variables is studied in the paper. It is shown that the complex nonlinear optimization problem for ...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
In this paper we present a generic interconnect fabric for transaction level modelling tackeling three major aspects. First, a review of the bus and IO structures that we have ana...
ASAP
2007
IEEE
13 years 7 months ago
2007
IEEE
Commercial designs are integrating from 10 to 100 embedded functional and storage blocks in a single system on chip (SoC) currently, and the number is likely to increase significa...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...