133 search results - page 22 / 27 » Resilient design in scaled CMOS for energy efficiency |
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ISCA
2005
IEEE
14 years 1 months ago
2005
IEEE
One of the most important problems faced by microarchitecture designers is the poor scalability of some of the current solutions with increased clock frequencies and wider pipelin...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
INTEGRATION
2008
13 years 7 months ago
2008
With the growing complexity in consumer embedded products, new tendencies forecast heterogeneous Multi-Processor SystemsOn-Chip (MPSoCs) consisting of complex integrated component...
NOCS
2010
IEEE
13 years 5 months ago
2010
IEEE
The number of cores present on-chip is increasing rapidly. The on-chip network that connects these cores needs to scale efficiently. The topology of on-chip networks is an importan...