768 search results - page 14 / 154 » Robustness of Sequential Circuits |
ITC
1989
IEEE
14 years 19 days ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
ICCAD
2001
IEEE
14 years 5 months ago
2001
IEEE
This paper attempts to determine the capabilities of existing Redundancy Addition and Removal (SRAR) techniques for logic optimization of sequential circuits. To this purpose, we ...
ICCAD
1998
IEEE
14 years 25 days ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
DATE
1997
IEEE
14 years 4 days ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
ISLPED
2003
ACM
14 years 1 months ago
2003
ACM
The power consumption of a sequential circuit can be reduced by decomposing it into subcircuits which can be turned off when inactive. Power can also be reduced by careful state e...