768 search results - page 40 / 154 » Robustness of Sequential Circuits |
IJFCS
1998
13 years 8 months ago
1998
Directed acyclic graphs (dags) are often used to model circuits. Path lengths in such dags represent circuit delays. In the vertex splitting problem, the objective is to determine...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
This paper uses under-approximation of unreachable states of a design to derive incomplete specification of combinational logic. The resulting incompletely-specified functions are...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
ASPDAC
2004
ACM
14 years 2 months ago
2004
ACM
— This paper focuses on checking safety properties for sequential circuits specified on the RTlevel. We study how different state encodings can be used to create a gate-level r...