768 search results - page 91 / 154 » Robustness of Sequential Circuits |
DAC
2010
ACM
13 years 6 months ago
2010
ACM
The verification of large radio-frequency/millimeter-wave (RF/MM) integrated circuits (ICs) has regained attention for high-performance designs beyond 90nm and 60GHz. The traditio...
DAC
2004
ACM
14 years 9 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
ICCD
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
TCAD
2008
13 years 8 months ago
2008
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
ICCD
2004
IEEE
14 years 5 months ago
2004
IEEE
— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...