173 search results - page 4 / 35 » Scan Architecture With Align-Encode |
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
ICCAD
2002
IEEE
14 years 5 months ago
2002
IEEE
DAC
2008
ACM
14 years 9 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
VTS
2003
IEEE
14 years 1 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
DATE
1999
IEEE
14 years 26 days ago
1999
IEEE
As an at-speed solution to board-level interconnect testing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-def...