376 search results - page 27 / 76 » Self-Assembled Circuit Patterns |
GLVLSI
2010
IEEE
14 years 12 days ago
2010
IEEE
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
DATE
2010
IEEE
14 years 20 days ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...