376 search results - page 55 / 76 » Self-Assembled Circuit Patterns |
ISVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper presents a new blocking logic to block unknowns for temporal compactors. The proposed blocking logic can reduce data volume required to control the blocking logic and a...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Inductance effects of on-chip interconnects have become more and more significant in today’s high-speed digital circuits, especially for global interconnects such as signal buse...