205 search results - page 3 / 41 » SoC Design and Test Considerations |
ITC
2003
IEEE
13 years 12 months ago
2003
IEEE
In a carefully structured study spanning several months, the authors visited numerous companies focused on Design For Test methodologies in SoC Test, Characterization, and Failure...
MSE
2003
IEEE
13 years 12 months ago
2003
IEEE
A tool has been created for use in a design course to automate integration of new components into a SystemOn-Chip (SoC). Students used this tool to implement a complete SoC Intern...
ITC
2003
IEEE
13 years 12 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
DT
2006
13 years 6 months ago
2006
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
CODES
2004
IEEE
13 years 10 months ago
2004
IEEE
In this paper, a novel method for high-level specification and validation of SoC designs using UML is proposed. UML is introduced as a formal model of specification for SoC design...