36 search results - page 4 / 8 » Soft Error Rates with Inertial and Logical Masking |
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
FPGA
2005
ACM
14 years 28 days ago
2005
ACM
FPGA-based designs are more susceptible to single-event upsets (SEUs) compared to ASIC designs. Soft error rate (SER) estimation is a crucial step in the design of soft error tole...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...