There is a growing concern about timing errors resulting from design marginalities and the effects of circuit aging on speed-paths in logic circuits. This paper presents a low ove...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
Smita Krishnaswamy, George F. Viamontes, Igor L. M...
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
Manufacturing disturbances are inevitable in the fabrication of integrated circuits. These disturbances will result in variations in the delay specications of manufactured circui...