Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault d...