Accurate statistical simulation and modeling are important for IC design. Different types of statistical simulation require different types of statistical models. In this paper a ...
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
Carlo Guardiani, Sharad Saxena, Patrick McNamara, ...
A methodology for hierarchicalstatistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principalcompon...
Eric Felt, Stefano Zanella, Carlo Guardiani, Alber...
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...