1459 search results - page 12 / 292 » Statistical Modeling for Circuit Simulation |
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...
TCAD
1998
13 years 7 months ago
1998
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
We describe an architectural design space exploration methodology that minimizes the energy dissipation of digital circuits. The centerpiece of our methodology is a Verilog-based ...