Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
This paper presents a design flow for an improved selective multi-threshold(Selective-MT) circuit. The Selective-MT circuit is improved so that plural MT-cells can share one switc...
This paper proposes a new hierarchical circuit modeling and simulation technique in s-domain for linear analog circuits. The new algorithm can perform circuit complexity reduction...
This paper proposes a novel wideband modeling technique for high-performance RF passives and linear(ized) analog circuits. The new method is based on a recently proposed sdomain h...
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...