871 search results - page 93 / 175 » Streaming Reduction Circuit |
ICCAD
2008
IEEE
14 years 7 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transie...
ISQED
2008
IEEE
14 years 4 months ago
2008
IEEE
— The dominant substrate noise coupling mechanism is determined for multiple switching gates based on a physically intuitive model. The model exhibits reasonable accuracy as comp...
ISPD
2004
ACM
14 years 3 months ago
2004
ACM
Considering the voltage drop constraint over a distributed model for power/ground (P/G) network, we study the following two problems for physical synthesis of sleep transistors: t...
DFT
2002
IEEE
14 years 3 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...