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DAC
2008
ACM
14 years 8 months ago
Parameterized timing analysis with general delay models and arbitrary variation sources
Many recent techniques for timing analysis under variability, in which delay is an explicit function of underlying parameters, may be described as parameterized timing analysis. T...
Khaled R. Heloue, Farid N. Najm
ITC
1998
IEEE
94views Hardware» more  ITC 1998»
13 years 11 months ago
A method of serial data jitter analysis using one-shot time interval measurements
A method for measuring inter-symbol interference, duty cycle distortion, random jitter and periodic jitter is described. The Blackman-Tukey method of signal analysis is used. This...
Jan B. Wilstrup
DAC
2002
ACM
14 years 8 months ago
A solenoidal basis method for efficient inductance extraction
The ability to compute the parasitic inductance of the interconnect is critical to the timing verification of modern VLSI circuits. A challenging aspect of inductance extraction i...
Hemant Mahawar, Vivek Sarin, Weiping Shi
DAC
2005
ACM
14 years 8 months ago
Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
ICCAD
2001
IEEE
144views Hardware» more  ICCAD 2001»
14 years 4 months ago
Faster SAT and Smaller BDDs via Common Function Structure
The increasing popularity of SAT and BDD techniques in verification and synthesis encourages the search for additional speed-ups. Since typical SAT and BDD algorithms are exponent...
Fadi A. Aloul, Igor L. Markov, Karem A. Sakallah