243 search results - page 8 / 49 » Synchronous Elastic Circuits |
EURODAC
1995
IEEE
14 years 4 days ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
ASPDAC
2004
ACM
14 years 2 months ago
2004
ACM
Abstract We propose a novel approach to preserve the synchronizing sequences of a circuit after retiming. The significance of this problem stems from the necessity of maintaining c...
DFT
2002
IEEE
14 years 1 months ago
2002
IEEE
Concurrent error detection (CED) methods are typically employed to provide an indication of the operational health of synchronous circuits during normal functionality. Existing CE...
SBCCI
2003
ACM
14 years 1 months ago
2003
ACM
Recycling was recently proposed as a system-level design technique to facilitate the building of complex System-on-Chips (SOC) by assembling pre-designed components. Recycling all...
ICCAD
1997
IEEE
14 years 24 days ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...