203 search results - page 23 / 41 » Test Generation and Fault Localization for Quantum Circuits |
DAC
2003
ACM
14 years 22 days ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
ICPR
2004
IEEE
14 years 8 months ago
2004
IEEE
Parallel processors such as SIMD computers have been successfully used in various areas of high performance image and data processing. Due to their characteristics of highly regula...
VTS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
DSD
2005
IEEE
13 years 9 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...