143 search results - page 11 / 29 » Test generation for designs with multiple clocks |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
DAC
2011
ACM
12 years 7 months ago
2011
ACM
Just as electronic systems implement computation in terms of voltage (energy per unit charge), molecular systems compute in terms of chemical concentrations (molecules per unit vo...
ICCAD
1999
IEEE
13 years 12 months ago
1999
IEEE
In Deep Sub-Micron (DSM) designs, performance will depend critically on the latency of long wires. We propose a new synthesis methodology for synchronous systems that makes the de...
DSD
2002
IEEE
14 years 17 days ago
2002
IEEE
This paper presents a design for a low-power digital matched filter (DMF) applicable to Wideband-Code Division Multiple Access (W-CDMA), which is a Direct-Sequence Spread-Spectrum...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...