112 search results - page 14 / 23 » Test generation in VLSI circuits for crosstalk noise |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
To achieve minimum signal propagation delay, the nonuniform wire width routing architecture has been widely used in modern VLSI design. The non-uniform routing architecture exploi...
ET
2002
13 years 7 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
ICCAD
2000
IEEE
14 years 1 days ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...