112 search results - page 22 / 23 » Test generation in VLSI circuits for crosstalk noise |
ISCAS
2002
IEEE
14 years 16 days ago
2002
IEEE
There is a need among scientists and clinicians for lownoise, low-power biosignal amplifiers capable of amplifying signals in the mHz to kHz range while rejecting large dc offsets...
ICCAD
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
ISLPED
1997
ACM
13 years 11 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...
VLSID
2008
IEEE
14 years 8 months ago
2008
IEEE
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...