244 search results - page 13 / 49 » Testing Digital Circuits with Constraints |
DT
2006
13 years 8 months ago
2006
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
ITC
1998
IEEE
14 years 26 days ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
ICCAD
1994
IEEE
14 years 22 days ago
1994
IEEE
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
ITC
2002
IEEE
14 years 1 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
DAC
1999
ACM
14 years 28 days ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...