244 search results - page 19 / 49 » Testing Digital Circuits with Constraints |
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
GLVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
A new split accumulator architecture to be used in direct digital frequency synthesizers (DDFS) systems is presented. This new design eliminates the need of adders on the section ...
ICCAD
1999
IEEE
14 years 2 months ago
1999
IEEE
In this paper, we propose a new robust approach to signal backtrace for efficiently testing embedded analog modules in a large system. The proposed signal backtrace method is form...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sam...
ISCAS
2005
IEEE
14 years 3 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...