570 search results - page 42 / 114 » The behavior of resistive circuits |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
For CMOS technologies below 65nm, gate oxide direct tunneling current is a major component of the total power dissipation. This paper presents a simulated annealing based algorith...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
A new technique for the logic synthesis of asynchronous circuits is presented. It is based on the structural theory of Petri nets and integer linear programming. The technique is ...
ICTAI
2002
IEEE
14 years 16 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...
ISCAS
2006
IEEE
14 years 1 months ago
2006
IEEE
—Behavioral modeling with virtual built-in self-test verification of high-speed wired link designs is described in this paper. Our procedure is based on principles of top-down mi...