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AEI
1998
98views more  AEI 1998»
13 years 7 months ago
Function-directed electrical design analysis
Functional labels provide a simple but very reusable way for defining the functionality of a system and for making use of that knowledge. Unlike more complex functional representa...
Chris J. Price
ICCD
2007
IEEE
105views Hardware» more  ICCD 2007»
14 years 1 months ago
Circuit-level mismatch modelling and yield optimization for CMOS analog circuits
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...
Mingjing Chen, Alex Orailoglu
GLVLSI
2010
IEEE
178views VLSI» more  GLVLSI 2010»
14 years 14 days ago
Improving the testability and reliability of sequential circuits with invariant logic
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris...
DAC
1997
ACM
13 years 11 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
ICCAD
1994
IEEE
115views Hardware» more  ICCAD 1994»
13 years 11 months ago
Fast transient power and noise estimation for VLSI circuits
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
Wolfgang T. Eisenmann, Helmut E. Graeb