570 search results - page 6 / 114 » The behavior of resistive circuits |
HICSS
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper proposes and validates a theory of physician resistance toward IT usage by drawing on prior research in the resistance to change literature and a recent dual-factor mod...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Historically, design margin and defects have been viewed as different topics, one part of design and the other part of test. Shrinking process geometries are making the two part o...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a ...
MR
2007
13 years 7 months ago
2007
Two extreme configurations under short circuit conditions leading to the punch through Trench IGBT failure under the effect of the temperature and the gate resistance have been st...
DFT
2003
IEEE
14 years 23 days ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...