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DAC
2002
ACM
14 years 11 months ago
Combined BEM/FEM substrate resistance modeling
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
Eelco Schrik, N. P. van der Meijs
DAC
2003
ACM
14 years 11 months ago
Multilevel floorplanning/placement for large-scale modules using B*-trees
We present in this paper a multilevel floorplanning/placement framework based on the B*-tree representation, called MB*-tree, to handle the floorplanning and packing for large-sca...
Hsun-Cheng Lee, Yao-Wen Chang, Jer-Ming Hsu, Hanna...
DAC
2004
ACM
14 years 11 months ago
Efficient on-line testing of FPGAs with provable diagnosabilities
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
Vinay Verma, Shantanu Dutt, Vishal Suthar
DAC
2006
ACM
14 years 11 months ago
Fast algorithms for slew constrained minimum cost buffering
As a prevalent constraint, sharp slew rate is often required in circuit design which causes a huge demand for buffering resources. This problem requires ultra-fast buffering techn...
Shiyan Hu, Charles J. Alpert, Jiang Hu, Shrirang K...
ICCD
2006
IEEE
148views Hardware» more  ICCD 2006»
14 years 7 months ago
Trends and Future Directions in Nano Structure Based Computing and Fabrication
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
R. Iris Bahar