1476 search results - page 28 / 296 » Three-dimensional integrated circuits |
113
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ISQED
2005
IEEE
15 years 8 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
114
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DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...
114
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DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
This paper demonstrates a system that performs multiobjective sizing across 100,000 analog circuit topologies simultaneously, with SPICE accuracy. It builds on a previous system, ...
130
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DATE
2003
IEEE
15 years 8 months ago
2003
IEEE
† Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some ...
128
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ICCAD
2000
IEEE
15 years 7 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...