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DAC
2002
ACM
14 years 8 months ago
Few electron devices: towards hybrid CMOS-SET integrated circuits
Adrian M. Ionescu, Michel J. Declercq, Santanu Mah...
VLSID
2005
IEEE
153views VLSI» more  VLSID 2005»
14 years 8 months ago
Electromigration-Aware Physical Design of Integrated Circuits
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
Göran Jerke, Jens Lienig