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DATE
2002
IEEE
14 years 14 days ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
ITC
2002
IEEE
14 years 12 days ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
ITC
2003
IEEE
14 years 23 days ago
2003
IEEE
ISCAS
2002
IEEE
14 years 12 days ago
2002
IEEE