282 search results - page 49 / 57 » Transient Fault Detectors |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—Flash-based FPGAs are increasingly demanded in safety critical fields, in particular space and avionic ones, due to their non-volatile configuration memory. Although they are al...
ASAP
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
We expect that in future commodity hardware will be used in safety critical applications. But the used commodity microprocessors will become less reliable because of decreasing fe...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...