4116 search results - page 99 / 824 » Type Analysis for CHIP |
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
ISPD
1998
ACM
14 years 1 months ago
1998
ACM
We propose a simple, isometry invariant pattern matching algorithm for an effective data reduction useful in layout-related data processing of very complex IC designs. The repeata...
CHES
2006
Springer
14 years 17 days ago
2006
Springer
Abstract. This paper introduces a refinement of the power-analysis attack on integrated circuits. By using a laser to illuminate a specific area on the chip surface, the current th...
HOST
2009
IEEE
14 years 3 months ago
2009
IEEE
—Outsourcing the fabrication of semiconductor devices to merchant foundries raises some issues concerning the IP protection of the design. Active hardware metering schemes try to...