This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breue...
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...