1093 search results - page 165 / 219 » Verifying VLSI Circuits |
VLSID
2006
IEEE
14 years 9 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
VLSID
2004
IEEE
14 years 9 months ago
2004
IEEE
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
Interconnect delay has become a critical factor in determining the performance of integrated circuits. Routing and buffering are powerful means of improving the circuit speed and ...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
We present an efficient implementation of an approximate balanced truncation model reduction technique for general large-scale RLC systems, described by a statespace model where t...
ICCD
2002
IEEE
14 years 5 months ago
2002
IEEE
We represent switching activity in VLSI circuits using a graphical probabilistic model based on Cascaded Bayesian Networks (CBN’s). We develop an elegant method for maintaining ...