1093 search results - page 73 / 219 » Verifying VLSI Circuits |
GLVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
Decreasing feature sizes and increasing package densities are making thermal issues extremely important in IC design. Uneven thermal maps and hot spots in ICs cause physical stres...
DFT
2000
IEEE
14 years 2 months ago
2000
IEEE
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
DAC
2003
ACM
14 years 11 months ago
2003
ACM
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
ISVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
SOI (silicon-on-insulator) technology suffers from a number of floating body effects, most notably parasitic bipolar and history effects. These are influenced by the rapidly incre...