63 search results - page 9 / 13 » Wrapper design for embedded core test |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
DATE
2003
IEEE
14 years 23 days ago
2003
IEEE
One of the difficult problems which core-based systemon-chip (SoC) designs face is test access. For testing the cores in a SoC, a special mechanism is required, since they are no...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...