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VLSID
2006
IEEE
156views VLSI» more  VLSID 2006»
14 years 8 months ago
SEAT-LA: A Soft Error Analysis Tool for Combinational Logic
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
Jungsub Kim, Mary Jane Irwin, Narayanan Vijaykrish...
ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
14 years 4 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
ASPDAC
2006
ACM
144views Hardware» more  ASPDAC 2006»
14 years 1 months ago
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...
DAC
2006
ACM
14 years 8 months ago
Subthreshold logical effort: a systematic framework for optimal subthreshold device sizing
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors i...
John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S....
DAC
2006
ACM
14 years 8 months ago
Gain-based technology mapping for minimum runtime leakage under input vector uncertainty
The gain-based technology mapping paradigm has been successfully employed for finding minimum delay and minimum area mappings. However, existing gain-based technology mappers fail...
Ashish Kumar Singh, Murari Mani, Ruchir Puri, Mich...