CAV
2008
Springer
14 years 1 months ago
2008
Springer
Abstract. This paper develops a local reasoning method to check lineartime temporal properties of concurrent programs. In practice, it is often infeasible to model check over the p...
ATVA
2008
Springer
14 years 1 months ago
2008
Springer
We present a new property driven pruning algorithm in dynamic model checking to efficiently detect race conditions in multithreaded programs. The main idea is to use a lockset base...
ATVA
2008
Springer
14 years 1 months ago
2008
Springer
marization using Abstract Transformers Daniel Kr
ATVA
2008
Springer
14 years 1 months ago
2008
Springer
Abstract. NetQi is a freely available model-checker designed to analyze network incidents such as intrusion. This tool is an implementation of the anticipation game framework, a va...
ASPDAC
2008
ACM
14 years 1 months ago
2008
ACM
Ball Grid Array packages in which I/O pins are arranged in a grid array pattern realize a number of connections between chips and a printed circuit board, but it takes much time in...
ASPDAC
2008
ACM
14 years 1 months ago
2008
ACM
Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power ...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
Rising interconnect delay and power consumption have motivated the investigation of alternative integrated circuit routing architectures. In particular, the X Architecture, which ...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract--This paper presents a method for automatic microarchitectural pipelining of systems with loops. The original specification is pipelined by performing provably-correct tra...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...